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NI

Engineer’s Guide to 5G Semiconductor Test

This resource is published by NI

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This Whitpaper paper focuses on the new challenges of testing semiconductor devices for wideband 5G applications.The enhanced mobile broadband (eMBB) use case points to supporting greater user data rates and increased system capacity. Departing from legacy 3G and 4G cellular standards,  MBB introduces radically higher operating frequency bands.

The rapid development of high-bandwidth 5G technologies has introduced significant challenges for testing and measuring new device RF performance. To keep pace with  aggressive 5G market demands, researchers and engineers need to rely on faster and more cost-effective test systems that can tackle these challenges. One of the toughest is  mmWave OTA test, both in the characterization lab and on the production floor. 

Although test and measurement systems must be designed to test current AiP devices, they also must be adaptable to deal with future beamforming and OTA testing requirements.

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Related categories
Components, Power, Communication, Connectors, Switches, Cellular, Connectors, Processors, Test software

 

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